The FEI Teneo VolumeScope^TM with ThruSight^TM Multi-Energy Deconvolution is a state-of-the-art serial block face imaging scanning electron microscope that combines physical and optical slicing technologies to produce up to 10nm isotropic 3D datasets of resin embedded biological samples. This field-leading 10nm isotropic resolution is possible through the use of FEI’s innovative ThruSight^TM multi-energy deconvolution technology, which allows optical sectioning to derive several virtual subsurface layers within each physical slice, thus dramatically improving resolution, particularly in the axial direction. 

Location:

CLSB Low Vibration Microscopy Suite room P2N016

Fast facts:

• On-stage compact microtome with easy installation for in-situ sectioning
• High and low vacuum options
• Optimal imaging resolution at low voltages
• High degree of automation and design for ease of-use

 

Features of the TeneoVS:

• Segmented in-lens T1 and in-lens T2 detectors for secondary electron and back scattered electrons
• MAPS^TM software integration for wide-field tissue mapping (Tiling and Stitching)
• MAPS^TM software integration for correlative light and electron microscopy (CLEM) studies
• ThruSight^TM Multi-Energy Deconvolution software to provide fully-automated, large-volume reconstructions

 

For more information: http://www.fei.com/products/sem/teneo-vs-sem-for-life-sciences/